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Glossary

F
fluorine
FA
failure analysis
FAB
fast atom bambardment
FAMOS
floating-gate avalanche-injection metal-oxide semiconductor
FC
flip chip
FCM
facilities cost model
FCS
factory control system
FDA
Food and Drug Administration
FDC
fault detection and classification
FDE
frequency domain experiments
Fe
iron
FEC
fabrication evaluation chip
FEM
finite element model
FEOL
front-end of line
FESEM
field emission scanning electron microscope/microscopy
FET
field-effect transistor
FFT
fast Fourier transform
FG
finished goods
FI
filterability index; Factory Integration
F/I
final inspect
FIB
focused ion beam
FID
flame ionization detector
FIFO
first-in, first-out
FIMS
front-opening interface mechanical standard
FIT
failure unit
FL
fuzzy logic
FLOODS
FLorida Object-Oriented Device Simulator
FLOOPS
FLorida Object-Oriented Process Simulator
FLOPC
floating point operations needed per cycle
FLOTOX
floating gate tunnel oxide
FLRT
factory layout/relayout tool
Fm
fermium
FM
foreign material
FMEA
failure mode and effects analysis
FMMC
factory material movement component
FMS
forms management system
FMVP
Framework Member Validation project
FNN
feed-forward neural network
FOCS
fiber optic chemical sensors
FOUP
front opening unified pod
FOV
field of view
FOX
field oxide
FP
flash point
FPD
focal-plane deviation; flat panel display
FPGA
field-programmable gate array
FPLA
field-programmable logic array
FPLF
field-programmable logic family
FPLS
field-programmable logic switch
FPM
flexual plate mode
FPMS
Factory Performance Modeling Software
FPROM
field-programmable read-only memory
FQA
fixed quality area
Fr
francium
FRACAS
Failure Reporting, Analysis, and Corrective Action System
FRAME
Failure Rate Analysis and Modeling
FRMB
fast ramp mini batch
FSM
finite state machine
FT
final test; Fourier transform
FTA
fault tree analysis
FTAB
Focus Technical Advisory Board
FTIR
Fourier transform infrared
FW
full wave
FWHM
full-width half-maximum
FZ
float zone