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Glossary
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- D/A
- digital to analog
- DAC
- digital-to-analog converter
- DARPA
- Defense Advanced Research Projects Agency (now ARPA)
- DAS
- direct absorption spectroscopy
- DASSL
- differential algebraic system solver
- D/B
- die bonding
- dBa
- adjusted decibel
- DBMS
- database management system
- DC
- direct current
- DCA
- direct chip attachment
- DCATS
- double-contained acid transfer system
- DCCF
- discounted cumulative cash flow
- DCE
- distributed computer environment
- DCG
- domain coordination group
- DCL
- digital command language; display communication log
- DCS
- dichlorosilane
- DDL
- device description language
- DDMS
- defect data management system
- DEDS
- discrete event dynamic simulation
- DES
- data encryption standard; display equipment status
- DF
- Darkfield
- DfESH
- Design for Environment, Safety, and Health
- DFLP
- design for low power
- DFM
- design for manufacturability
- DFR
- design for reliability
- DFT
- design for testability; design for test
- DHF
- dilute hydrofluoric acid
- DI
- deionized; dielectric isolation
- D/I
- develop inspect
- DIC
- differential interference contrast
- DICE
- DARPA Initiative in Concurrent Engineering
- DIL
- dual inline
- DIP
- dual inline package
- DLBI
- device level burn-in
- DLOC
- developed source lines of code
- DLS
- display lot status
- DLT
- device level test
- DLTS
- deep level transient spectroscopy
- DM
- defect management
- DMA
- direct memory access; dynamic mechanical analysis
- DMH
- display message helps
- DML
- data manipulation language; display message log
- DMM
- digital multimeter
- DMOS
- diffused metal-oxide semiconductor
- DMR
- display move requests
- DMS
- Data Management Standard
- DPS
- display process status
- DO
- dynamic optimization
- DOA
- dead-on alignment
- DOAS
- differential optical absorption spectroscopy
- DOE
- design of experiments
- DOF
- depth of field; depth of focus
- DOP
- dioctylphthalate
- DOS
- disk operating system
- DOTS
- digital-optical technology system
- DPA
- destructive physical analysis
- DPI
- dots per inch
- DPM
- digital panel meter
- DPSRAM
- dual-port static random access memory
- DRAM
- dynamic random access memory
- DRAPAC
- Design Rule and Process Architecture Council
- DRC
- design rule check
- DRE
- destruction removal efficiency
- DRIFTS
- diffuse reflectance infrared Fourier transform spectroscopy
- DRT
- defect review tool
- DSA
- display system activity
- DSC
- differential scanning calorimetry
- DSF
- dead space free
- DSMC
- direct simulation Monte Carlo
- DSP
- differential signal processing; digital signal processing
- DSS
- display stocker status
- DSQ
- downstream quartz
- DSW
- direct step-on-wafer
- DT
- dynamic test
- DTA
- differential thermal analysis
- DTC
- direct thermocouple control
- DTL
- diode transistor logic
- DTM
- defect test monitor; delay time multiplier; device test module;digital terrain map
- DTMPN
- defect test monitor phase number
- DUF
- diffusion under epitaxial film
- DUT
- device under test
- DUV
- deep ultraviolet
- DV
- design verification
- DVER
- design rule verification
- DVI
- digital video interactive
- DVM
- digital voltmeter
- DVS
- display vehicle status
- DWG
- domain work group
- Dy
- dysprosium
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