|
The XPS handler is a tri-temp in line test handling system, reel / ammopack
to reel handler for taped semiconductors especially four-pin axial
Hall sensor testing. The machine tape transport operates in a synchronously
way, thus assuring precise device tracking.
There are two main modifications of the XPS handlers:
- XPSC - equipped with two-category cutters;
- XPSP - equipped with four-category
puncher and cutter.
The XPS Handlers
consist of eight blocks:
- Loader and Input Buffer;
- Test Site Hot;
- Synchronization Buffer;
- Test Site Ambient;
- Synchronization Buffer;
- Test Site Cold;
- Cutter / Category Puncher;
- Unloader;
The loader is a tray or unreel module with integrated buffering system.
Devices are pulled through the 3 in line test sites by means of stepper
motors with an accuracy of 0.05mm.
The test sequence is Hot (125 °C / 150 °C), Ambient and Cold (typically
-40 °C), each test site has his own soak area which is controlled
by PID controllers except for the ambient section. Small buffers are
used to synchronize the devices (data log, characterization, trimming),
by means of "deliver one, then pull out another" principle,
controlled by sensors and error trapping.
Due to the nature of Hall components (small package) the contact blocks
are temperature controlled as well, to avoid the device to change temperature
while contacting and testing (unrelated with test time). The cold section
uses a patented cooling technique for -40 °C, using no liquid nitrogen
based on cooling liquid and Peltier effect.
Each test section has an integrated reference sensor and an electromagnet,
capable of generating a 600Gauss positive or negative field, aligned
around the DUT. The Unloader reel which is the last section is preceded
by a two bin category bulk cutter sections or one bulk cutter with
a four-category puncher.
The option category puncher has to be selected when one want to use
the tape later on to produce consecutive "same bin" tapes
using our XRET re-taper.
Reliability
High uptime with excellent device tracking, fast reloading and low
meantime to repair.
Optical detection is used to align the device into the contact block,
while a sensor controlled mechanism is used to track and assure device
tracking. A reference magnetic sensor is used to feedback the applied
magnetic field at the DUT's position.
Specifications | Download
PDF Brochure
|