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Automatic Test Equipment
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- XTT
Mixed-signal up to 96 channel ASIC testers. 1 MHz pattern speed (125 ns
edge placement resolution), 2 analog buses, 14-bit ADC, 12 V / 200 mA
programmable power supplies.
- XTA
Mixed-signal 128-channel ASIC testers. 40 MHz pattern speed (3ns edge placement
resolution), 4 analog buses, 16-bit ADC, ±110 V / 250 mA or ±55 V / 500mA
programmable power supplies, 40 MHz 12-bit data acquisition and arbitrary
waveform generation unit.
- Linear Hall Test Station
Linear Test Station
- Rotary Hall Test Station
Rotary Test Station
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Legacy
Equipment
Real
Time Wafer Mapper
OEM
Engineering
Maintenance
Training
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